Add noise receiver to 26.5 GHz
4-port, configurable test set, second source, attenuators, combiner, mechanical switches, bias tees, low frequency extension
VECTOR NOISE FIGURE
NODE-LOCKED PERPETUAL LICENSE
Keysight Software Support While On Rent
Cord Power
Qty: 1Adapter 3.5 mm(f) - 3.5 mm(m)
Qty: 1Wrench Torque 8 in/lb 20 mm Open End
Qty: 1Cable Assembly RF Jumper
Qty: 16Cable Guard
Qty: 2Cable Guard
Qty: 1Cable Assembly Semi-Rigid
Qty: 1Cover Front Impact Gray
Qty: 1Cover Impact Rear Phantom Gray
Qty: 1Keyboard USB
Qty: 1Mouse Optical
Qty: 1USB Drive with Software and Manuals
Qty: 1Add noise receiver to 26.5 GHz
4-port, configurable test set, second source, attenuators, combiner, mechanical switches, bias tees, low frequency extension
Noise figure measurements with vector correction
Node-locked perpetual license
Synthesizer and reference assembly, version 7 DDS, dual-source
Enhanced low phase noise performance
Keysight Software Support While On Rent
Cord Power
Qty: 1Adapter 3.5 mm(f) - 3.5 mm(m)
Qty: 1Wrench Torque 8 in/lb 20 mm Open End
Qty: 1Cable Assembly RF Jumper
Qty: 16Cable Guard
Qty: 2Cable Guard
Qty: 1Cable Assembly Semi-Rigid
Qty: 1Cover Front Impact Gray
Qty: 1Cover Impact Rear Phantom Gray
Qty: 1Keyboard USB
Qty: 1Mouse Optical
Qty: 1USB Drive with Software and Manuals
Qty: 1Add noise receiver to 26.5 GHz
4-port, configurable test set, second source, attenuators, combiner, mechanical switches, bias tees, low frequency extension
VECTOR NOISE FIGURE
NODE-LOCKED PERPETUAL LICENSE
Synthesizer Version 7
Keysight Software Support While On Rent
Add IF inputs
Enhanced low phase noise performance
Cord Power
Qty: 1Adapter 3.5 mm(f) - 3.5 mm(m)
Qty: 1Wrench Torque 8 in/lb 20 mm Open End
Qty: 1Cable Assembly RF Jumper
Qty: 16Cable Guard
Qty: 2Cable Guard
Qty: 1Cable Assembly Semi-Rigid
Qty: 1Cover Front Impact Gray
Qty: 1Cover Impact Rear Phantom Gray
Qty: 1Keyboard USB
Qty: 1Mouse Optical
Qty: 1USB Drive with Software and Manuals
Qty: 1Add IF inputs
Add pulse modulator to internal 1st source
Add pulse modulator to internal 2nd source
Add noise receiver to 26.5 GHz
4-port, configurable test set, second source, attenuators, combiner, mechanical switches, bias tees, low frequency extension
Pulse/IO Adapter
VECTOR NOISE FIGURE
Keysight Software Support While On Rent
NODE-LOCKED PERPETUAL LICENSE
Synthesizer Version 7
Cord Power
Qty: 1Adapter 3.5 mm(f) - 3.5 mm(m)
Qty: 1Wrench Torque 8 in/lb 20 mm Open End
Qty: 1Cable Assembly RF Jumper
Qty: 16Cable Guard
Qty: 2Cable Guard
Qty: 1Cable Assembly Semi-Rigid
Qty: 1Cover Front Impact Gray
Qty: 1Cover Impact Rear Phantom Gray
Qty: 150 ohm SMA Terminator, male
Qty: 3USB Drive with Software and Manuals
Qty: 1PULSE/IO ADAPTER
Qty: 1Keysight Technologies PNA Configuration Guide
Content is AI-generated. Verify critical details with manufacturer-provided resources.
The Keysight N5242B with Option 425 is a 4-port PNA-X microwave network analyzer covering 900 Hz to 26.5 GHz with low-frequency extension (LFE) down to 900 Hz. Option 425 is the most fully featured configuration, including a configurable test set with source and receiver attenuators, an internal second source, a combiner, mechanical switches, bias tees, and LFE hardware. The N5242B features 50 ohm, ruggedized 3.5 mm male test port connectors.
The LFE feature extends the start frequency of the N5242B PNA-X down to 900 Hz. With LFE enabled, measurements from 500 Hz to 100 MHz use LFE hardware, while measurements above 100 MHz use standard hardware. The extended start frequency supports standard S-parameter measurements, gain compression (amplifier and converters), and magnitude-only scalar mixer/converter measurements.
The N5242B Option 425 provides system dynamic range following the 4-port configurable test set specifications. With LFE enabled, the typical system dynamic range ranges from 105 dB at 500 Hz to 900 Hz, up to 127 dB at 1 to 5 MHz, and 116 to 117 dB from 10 to 100 MHz. Above 100 MHz, the performance aligns with standard 4-port specifications, reaching up to 140 dB at higher microwave frequencies.
The 4-port configuration enables differential and I/Q device measurements (S93089B), true-mode stimulus (S93460B), and active hot parameters (S93110B). The internal combiner supports two-tone intermodulation distortion measurements, and the dual sources allow mixer and frequency converter testing. Note that LFE is disabled when using active hot parameters (S93110B).
In the standard channel, pulsed RF, true-mode stimulus, and source phase control are not supported for measurements below 10 MHz. Additionally, enhanced time domain analysis with TDR (S93011B), noise figure measurements, modulation distortion, and spectrum analysis are not compatible with the LFE feature. Standard S-parameter measurements, gain compression, and magnitude-only mixer measurements are supported below 10 MHz.
Option 425 includes all the capabilities of Option 423 (4-port, dual sources, attenuators, bias tees, combiner, and mechanical switches) plus adds low-frequency extension hardware to reach down to 900 Hz. This makes Option 425 the most comprehensive configuration for the N5242B. The LFE measurement range overlaps with the standard range from 10 MHz to 100 MHz.
The N5242B supports calibration using mechanical calibration kits and electronic calibration (ECal) modules appropriate for 3.5 mm connectors. Calibration certification options include ISO 17025 compliant (Option 1A7), ANSI Z540 compliant (Option A6J), and commercial calibration with test data (Option UK6). Built-in performance test software (S93898B) is available for self-maintainers.
The N5242B PNA-X with Option 425 supports IF bandwidth settings that allow users to trade measurement speed for dynamic range, with narrower IF bandwidths (such as 10 Hz) providing maximum dynamic range up to 140 dB at microwave frequencies. For high-throughput testing, the optional Fast CW measurement application (S93118B) enables rapid swept or CW measurements. The 4-port configurable test set with dual internal sources and mechanical switches further reduces test time by eliminating the need for manual reconnections during multi-parameter device characterization.